Focused ion beam (FIB) in situ lift-out (INLO) technique showing the

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

An INLO sample mounted on a TEM grid.

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FIB thinning ‒ CIME ‐ EPFL

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

Emmanuel PEREZ, Senior Engineer, Materials Science and Engineering, PhD, Savannah River National Laboratory, South Carolina, SRNL

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Kleindiek Nanotechnik: Ex-situ lift-out

Kleindiek Nanotechnik: In-situ lift-out

FIB milling with liftout

Focused Ion Beam Technology - an overview

Focused Ion Beams (FIB) — Novel Methodologies and Recent

In situ lift-out dedicated techniques using FIB–SEM system for TEM